Read full paper at: http://www.scirp.org/journal/PaperInformation.aspx?PaperID=53699#.VM85lSzQrzE Author(s) Yamada 1 , T. Sasaki 1 , T. Nagata 1 , I. Kanazawa 1* , R. Suzuki 2 , T. Ohdaira 2 , K. Nozawa 3 , F. Komori 3 Affiliation(s) 1 Department of Physics, Tokyo Gakugei University, Tokyo, Japan . 2 The National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan . 3 Institute of Solid State Physics, University of Tokyo, Chiba, Japan . ABSTRACT The positron annihilation lifetimes and the Doppler broadening by slow positron beam are measured in thin Fe films with thickness 500 nm, a thin Hf film with thickness 100 nm, and the bilayer Fe (50 nm)/Hf (50 nm) on quartz glass substrate. We have analyzed the behavior in vacancy-type defects in each layer through some deposition temperatures and annealing. It is observed that the thin Fe film, the thin Hf film, and the bilayer Fe (50 nm)/Hf (50 nm) already con...
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