Viscosity Effects of the Precursor Solution and Surface Structure of Gadolinium Oxide (Gd2O3) and Gadolinium Oxide Europium Doped (Gd2O3:Eu3+) Sol-Gel Films
Read full paper at:
http://www.scirp.org/journal/PaperInformation.aspx?PaperID=52061#.VIEEaWfHRK0
http://www.scirp.org/journal/PaperInformation.aspx?PaperID=52061#.VIEEaWfHRK0
Author(s)
The sol-gel method is a novel technique for the
preparation of thin films. In this research, gadolinium oxide (Gd2O3) and gadolinium oxide europium doped (Gd2O3:Eu3+)
films prepared via the sol-gel and dip coating methods were
investigated. In addition to the elaboration on the sol-gel preparation
routes and additional observations of the films’ surface morphology as
characterized by scanning electron microscope (SEM), we determined via
viscosity measurements that the sols were stable for 398 days. FTIR
analysis of the Gd2O3 and Gd2O3:Eu3+
dip coated films was made to monitor the decomposition and oxidation
reactions that occurred during processing as well as process stability.
KEYWORDS
Cite this paper
Johnson, Q. , Edwards, M. , Herring, J. and Curley,
M. (2014) Viscosity Effects of the Precursor Solution and Surface
Structure of Gadolinium Oxide (Gd2O3) and Gadolinium Oxide Europium Doped (Gd2O3:Eu3+) Sol-Gel Films. Materials Sciences and Applications, 5, 1027-1033. doi: 10.4236/msa.2014.514105.
| [1] |
Takagi, K. and Fukuzawa, T.
(1983) Cerium-Activated Gd2SiO5 Single Crystal Scintillator. Applies
Physics Letters, 42, 43-45. http://dx.doi.org/10.1063/1.93760 |
| [2] |
Gambaccini, M., Taibi, A.,
Baldelli, P., Del Guerra, A. and Tuffanelli, A. (1998) Image Noise
Properties of a Phosphor-Coated CCD X-Ray Detector. Nuclear Instruments
and Methods in Physics Research Section A: Accelerators, Spectrometers,
Detectors and Associated Equipment, 409, 508-510. http://dx.doi.org/10.1016/S0168-9002(97)01304-1 |
| [3] |
Guo, H., Yang, X., Xiang, T.,
Zhang, W., Lou, L. and Mugnier, J. (2004) Structure and Optical
Properties of Sol-gel Derived Gd2O3 Waveguide Films. Applied Surface
Science, 230, 215-221.
http://dx.doi.org/10.1016/j.apsusc.2004.02.032 |
| [4] |
Bae, J.S., Shim, K.S., Yang,
H.K., Moon, B.K., Jeong, J.H., Kim, Y.S., Yi, S.S. and Kim, J.H. (2006)
Surface Morphology and Crystalline Phase Dependent Photoluminescence of
Gd2O3:Eu3+ Thin Films Grown on Various Substrates. Thin Solid Films,
515, 2497-2500. http://dx.doi.org/10.1016/j.tsf.2006.07.088 |
| [5] |
Augusciuk, E. (2012) Method of
m-Line Spectroscopy, A Good Tool to Determine and Control the Optical
Parameters of Waveguide Structures. Proceeding of SPIE, 8702,
870207-870211. http://dx.doi.org/10.1117/12.2010911 |
| [6] |
Garcia-Murillo, A., Le Luyer,
C., Dujardin, C., Pedrini, C. and Mugnier, J. (2001) Elaboration and
Characterization of Gd2O3 Waveguiding Thin Films Prepared by the Sol-gel
Process. Optical Materials, 16, 39-46.
http://dx.doi.org/10.1016/S0925-3467(00)00057-4 |
| [7] |
Liu, X., Liu, B., Gu, M., Xiao,
L. and Xu, X. (2006) Highly Enhanced Photoluminescence and X-Ray Excited
Luminescence of Li Doped Gd2O3:Ee3+ Thin Films. Solid State
Communications, 137, 162.
http://dx.doi.org/10.1016/j.ssc.2005.10.018 |
| [8] |
Le Luyer, C., Garcia-Murillo,
A., Bernstein, E. and Mugnier, J. (2003) Waveguide Raman Spectroscopy of
Sol-Gel Gd2O3 Thin Films. Journal of Raman Spectroscopy, 34, 234-239. http://dx.doi.org/10.1002/jrs.980 |
| [9] |
Ferrara, M.C., Altamura, D.,
Schioppa, M., Tapfer, L., Nichelatti, E., Pilloni, L. and Montecchi, M.
(2008) Growth, Characterization and Optical Properties of
Nanocrystalline Gadolina Thin Films Prepared by Sol-Gel Dip Coating.
Journal of Physics D: Applied Physics, 41, Article ID: 225408. http://dx.doi.org/10.1088/0022-3727/41/22/225408 |
| [10] | Johnson, Q.S., Edwards, M. and Curley, M. (2013) Analysis of the Refractive Index and Film Thickness of Eu Doped Gadolinium Oxide (Gd2O3) Planar Waveguides Fabricated by the Sol-Gel And Dip Coating Methods. Proceedings of SPIE, 8847, 884706. eww141205lx |
| [11] | Gaucher, P., Hector, J. and Kurfiss, J.C. (1995) NATO ASI Series, Ser. E. Science and Technology of Electroceramic Thin Films, 284, 147. |
评论
发表评论