Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM
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Author(s)
Transmission electron microscopy (TEM) is a very
powerful technique for materials characteriza-tion, providing
information relating to morphology, composition, and crystal structure.
Selected area diffraction patterns (SADPs) are crystallographic data
that can be obtained using a TEM in-strument. Conventional
identification through SADP/TEM is tricky and tedious, thereby
increasing the difficulty of phase identification. To establish a
procedure for phase identification of known and unknown phases, in this
study we examined two samples: one, a known phase, was Si with
<100> alignment; the other, unknown, was the TixOy
phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia
(YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The
procedures for phase identification of the known and unknown phases are
described herein using a series of SADPs and energy dispersive
spectrometry within TEM that would be useful for general researchers.
KEYWORDS
Cite this paper
Lin, K. (2014) Phase Identification Using Series
of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry
within TEM. Microscopy Research, 2, 57-66. doi: 10.4236/mr.2014.24008.
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